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Transmission increase upon switching of VO2 thin films on microstructured surfaces

dc.contributor.authorKarakurt, İsmailen_US
dc.contributor.authorBoneberg, Johannesen_US
dc.contributor.authorLeiderer, Paulen_US
dc.contributor.authorLopez, Reneen_US
dc.contributor.authorHalabica, A.en_US
dc.contributor.authorHaglund, Richard F.en_US
dc.date.accessioned2015-01-15T23:00:48Z
dc.date.available2015-01-15T23:00:48Z
dc.date.issued2007-08-27
dc.identifier.citationKarakurt, İ., Boneberg, J., Leiderer, P., Lopez, R., Halabica, A. & Haglund, R. F. (2007). Transmission increase upon switching of VO2 thin films on microstructured surfaces. Applied Physics Letters, 91(9), 1-4. doi:10.1063/1.2776368en_US
dc.identifier.issn0003-6951
dc.identifier.issn1520-8842
dc.identifier.urihttps://hdl.handle.net/11729/244
dc.identifier.urihttp://dx.doi.org/10.1063/1.2776368
dc.descriptionTwo of the authors (I.K. and R.F.H.) gratefully acknowledge the support of the Alexander von Humboldt Foundation through Research Fellowship and Senior Scientist Award, respectively. Vanadium dioxide research at Vanderbilt was supported by the National Science Foundation through a Nanoscience Interdisciplinary Research Team Grant No. (DMR-0210785) and a Major Research Instrumentation Grant No. (DMR-9871234).en_US
dc.description.abstractThe authors compare transmission measurements of near-infrared light through VO2 thin films on smooth substrates and on ordered arrays of silica microspheres. When the samples are heated above the critical temperature for the semiconductor-metallic phase transition, smooth thin films show reduced transmission independent of thickness; however, the VO2 film deposited on the microspheres may show either reduced or enhanced transmission, depending on VO2 film thickness. They show that this at a first glance, unexpected behavior is directly related to the change of scattering efficiency upon the phase transition. This suggests that optical transmission through thin-film microstructures could be tuned by an appropriate combination of microsphere ordering and VO2 film thickness.en_US
dc.description.sponsorshipNational Science Foundationen_US
dc.description.sponsorshipDirectorate for Mathematical and Physical Sciencesen_US
dc.description.sponsorshipAlexander von Humboldt-Stiftungen_US
dc.language.isoengen_US
dc.publisherAmerican Institute of Physicsen_US
dc.relation.isversionof10.1063/1.2776368
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectColloid monolayersen_US
dc.subjectInsulator transitionen_US
dc.subjectLithographyen_US
dc.subjectMetal phase-transitionen_US
dc.subjectNanoparticlesen_US
dc.subjectSemiconductoren_US
dc.subjectFilm thicknessen_US
dc.subjectLight transmissionen_US
dc.subjectMicrospheresen_US
dc.subjectMicrostructureen_US
dc.subjectPhase transitionsen_US
dc.subjectSilicaen_US
dc.subjectMicrostructured surfacesen_US
dc.subjectScattering efficiencyen_US
dc.subjectSilica microspheresen_US
dc.subjectTransmission measurementsen_US
dc.subjectThin filmsen_US
dc.titleTransmission increase upon switching of VO2 thin films on microstructured surfacesen_US
dc.typearticleen_US
dc.description.versionPublisher's Versionen_US
dc.relation.journalApplied Physics Lettersen_US
dc.contributor.departmentIşık Üniversitesi, Fen Edebiyat Fakültesi, Fizik Bölümüen_US
dc.contributor.departmentIşık University, Faculty of Arts and Sciences, Department of Physicsen_US
dc.contributor.authorID0000-0002-6679-091X
dc.identifier.volume91
dc.identifier.issue9
dc.identifier.startpage1
dc.identifier.endpage4
dc.peerreviewedYesen_US
dc.publicationstatusPublisheden_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.contributor.institutionauthorKarakurt, İsmailen_US
dc.relation.indexWOSen_US
dc.relation.indexScopusen_US
dc.relation.indexScience Citation Index Expanded (SCI-EXPANDED)en_US
dc.description.qualityQ2
dc.description.wosidWOS:000249156100030


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