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dc.contributor.authorAksen, Ahmettr_TR
dc.contributor.authorÇimen, Ebru Gürsutr_TR
dc.contributor.authorYarman, Bekir Sıddık Binboğatr_TR
dc.date.accessioned2015-07-14T23:48:30Z
dc.date.available2015-07-14T23:48:30Z
dc.date.issued1998
dc.identifier.citationAksen, A., Cimen, E. G., & Yarman, S. B. (1998). Numerical real frequency broadband matching technique based on parametric representation of scattering parameters. (pp. 351-354)en_US
dc.identifier.isbn0780351460
dc.identifier.otherWOS:000079541400089
dc.identifier.urihttp://hdl.handle.net/11729/693
dc.description.abstractIn this study, a computer, aided broadband matching technique based on the parametric representation of scattering parameters is proposed. The new technique combines the advantageous of the so called parametric approach utilizing the impedance formalizm and the real frequency scattering technique. With the reformulation of these real frequency techniques, some laborous numerical computational steps are omitted. The descriptive network functions are obtained in an explicit form without any need to the polynomial factorizations and the solution of equation sets. The application of the technique and the comparision of the results with those of the other real frequency approaches is discussed on examples.en_US
dc.language.isoenen_US
dc.publisherIEEE
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.source1998 IEEE Asia-Pacific Conference on Circuits and Systemsen_US
dc.titleA numerical real frequency broadband matching technique based on parametric representation of scattering parametersen_US
dc.typeconferenceObjecten_US
dc.description.versionPublisher's Versionen_US
dc.contributor.departmentIşık Üniversitesi, Mühendislik Fakültesi, Elektrik-Elektronik Mühendisliği Bölümütr_TR
dc.contributor.departmentIsik University, Faculty of Engineering, Department of Electrical-Electronics Engineeringen_US
dc.contributor.authorIDTR167538
dc.contributor.authorIDTR32426
dc.contributor.authorIDTR55061
dc.identifier.startpage351
dc.identifier.endpage354
dc.peerreviewedYesen_US
dc.publicationstatusPublisheden_US


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