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dc.contributor.authorYarman, Bekir Sıddık Binboğaen_US
dc.contributor.authorKılınç, Alien_US
dc.contributor.authorAksen, Ahmeten_US
dc.date.accessioned2015-01-15T23:00:07Z
dc.date.available2015-01-15T23:00:07Z
dc.date.issued2004-11
dc.identifier.citationYarman, B. S. B., Kılınç, A. & Aksen, A. (2004). Immitance data modelling via linear interpolation techniques: A classical circuit theory approach. International Journal of Circuit Theory and Applications, 32(6), 537-563. doi:10.1002/cta.295en_US
dc.identifier.issn0098-9886en_US
dc.identifier.urihttps://hdl.handle.net/11729/145
dc.identifier.urihttp://dx.doi.org/10.1002/cta.295
dc.description.abstractWith the advancement of the manufacturing technologies to produce new generation analog/digital communication systems, immitance data modelling has gained renewed importance in the literature. Specifically, models are utilized for behaviour characterization, simulation of physical devices or to design sub-systems with active and passive solid-state devices. Therefore, in this paper, new computer aided tools are presented to model one port immitance data by means of linear interpolation techniques. The basic philosophy of the new modelling tools is based on the numerical decomposition of the immitance data into its minimum and Foster parts. Computer algorithms are presented to model the minimum and the Foster parts of the given immitance data. Implementations of these algorithms are exhibited by means of examples. Depending on the application, modelling tools based on linear interpolation techniques may present 'computational and practical' advantages over the existing interpolation techniques, non-linear curve fittings or regression methods. It is expected that the new modelling tools will be utilized to provide initial circuit topologies to the commercially available analysis/simulation and design packages.en_US
dc.language.isoenen_US
dc.publisherWiley-Blackwellen_US
dc.relation.ispartofInternational Journal of Circuit Theory and Applicationsen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectVLSI interconnectsen_US
dc.subjectNetworksen_US
dc.subjectToolen_US
dc.subjectNumerical modellingen_US
dc.subjectData modellingen_US
dc.subjectImmitance modellingen_US
dc.subjectLinear interpolationen_US
dc.subjectLagrange interpolationen_US
dc.subjectDevice modellingen_US
dc.subjectCADen_US
dc.subjectAlgorithmsen_US
dc.subjectCircuit theoryen_US
dc.subjectComputer aided designen_US
dc.subjectComputer simulationen_US
dc.subjectData reductionen_US
dc.subjectDigital communication systemsen_US
dc.subjectLagrange multipliersen_US
dc.subjectData modellingen_US
dc.subjectDevice modelingen_US
dc.subjectImmitance modellingen_US
dc.subjectInterpolationen_US
dc.titleImmitance data modelling via linear interpolation techniques: a classical circuit theory approachen_US
dc.typeArticleen_US
dc.description.versionPublisher's Versionen_US
dc.departmentIşık Üniversitesi, Mühendislik Fakültesi, Elektrik-Elektronik Mühendisliği Bölümüen_US
dc.departmentIşık University, Faculty of Engineering, Department of Electrical-Electronics Engineeringen_US
dc.authorid0000-0003-1562-5524
dc.authorid0000-0002-3412-5077
dc.authorid0000-0001-7937-8580
dc.authorid0000-0003-1562-5524en_US
dc.authorid0000-0002-3412-5077en_US
dc.authorid0000-0001-7937-8580en_US
dc.identifier.volume32
dc.identifier.issue6
dc.identifier.startpage537
dc.identifier.endpage563
dc.peerreviewedYesen_US
dc.publicationstatusPublisheden_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.institutionauthorYarman, Bekir Sıddık Binboğaen_US
dc.institutionauthorKılınç, Alien_US
dc.institutionauthorAksen, Ahmeten_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.indekslendigikaynakScience Citation Index Expanded (SCI-EXPANDED)en_US
dc.identifier.wosqualityQ3
dc.identifier.wosqualityQ3en_US
dc.identifier.wosWOS:000225806800006
dc.identifier.wosWOS:000225806800006en_US
dc.identifier.scopus2-s2.0-10244240679en_US
dc.identifier.doi10.1002/cta.295
dc.identifier.scopusqualityQ2en_US


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