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dc.contributor.authorYıldız, Olcay Taneren_US
dc.date.accessioned2015-01-15T23:01:52Z
dc.date.available2015-01-15T23:01:52Z
dc.date.issued2011-04
dc.identifier.citationYıldız, O. T. (2011). Mapping classifiers and datasets. Expert Systems with Applications, 38(4), 3697-3702. doi:10.1016/j.eswa.2010.09.027en_US
dc.identifier.issn0957-4174en_US
dc.identifier.urihttps://hdl.handle.net/11729/417
dc.identifier.urihttp://dx.doi.org/10.1016/j.eswa.2010.09.027
dc.description.abstractGiven the posterior probability estimates of 14 classifiers on 38 datasets, we plot two-dimensional maps of classifiers and datasets using principal component analysis (PCA) and Isomap. The similarity between classifiers indicate correlation (or diversity) between them and can be used in deciding whether to include both in an ensemble. Similarly, datasets which are too similar need not both be used in a general comparison experiment. The results show that (i) most of the datasets (approximately two third) we used are similar to each other, (ii) multilayer perceptrons and k-nearest neighbor variants are more similar to each other than support vector machine and decision tree variants. (iii) the number of classes and the sample size has an effect on similarity.en_US
dc.language.isoenen_US
dc.publisherPergamon-Elsevier Science Ltden_US
dc.relation.ispartofExpert Systems With Applicationsen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectClassifiersen_US
dc.subjectDatasetsen_US
dc.subjectNo free lunch theoremen_US
dc.subjectPCAen_US
dc.subjectIsomapen_US
dc.subjectLearning algorithmsen_US
dc.subjectClassification (of information)en_US
dc.subjectLearning systemsen_US
dc.subjectComplexity measuresen_US
dc.subjectData setsen_US
dc.subjectK-nearest neighborsen_US
dc.subjectMulti-layer perceptronsen_US
dc.subjectPosterior probabilityen_US
dc.subjectSample sizesen_US
dc.subjectTwo-dimensional mapen_US
dc.subjectDecision treesen_US
dc.subjectPattern recognition systemsen_US
dc.subjectPrincipal component analysisen_US
dc.subjectProbabilityen_US
dc.subjectClassifiersen_US
dc.titleMapping classifiers and datasetsen_US
dc.typeArticleen_US
dc.description.versionPublisher's Versionen_US
dc.description.versionAuthor Pre-Printen_US
dc.departmentIşık Üniversitesi, Mühendislik Fakültesi, Bilgisayar Mühendisliği Bölümüen_US
dc.departmentIşık University, Faculty of Engineering, Department of Computer Engineeringen_US
dc.authorid0000-0001-5838-4615
dc.authorid0000-0001-5838-4615en_US
dc.identifier.volume38
dc.identifier.issue4
dc.identifier.startpage3697
dc.identifier.endpage3702
dc.peerreviewedYesen_US
dc.publicationstatusPublisheden_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.institutionauthorYıldız, Olcay Taneren_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.indekslendigikaynakScience Citation Index Expanded (SCI-EXPANDED)en_US
dc.identifier.wosqualityQ1
dc.identifier.wosqualityQ1en_US
dc.identifier.wosWOS:000286904600087
dc.identifier.wosWOS:000286904600087en_US
dc.identifier.scopus2-s2.0-78650689421en_US
dc.identifier.doi10.1016/j.eswa.2010.09.027
dc.identifier.scopusqualityQ1en_US


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