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Software defect prediction using Bayesian networks
(Springer, 2014-02)
There are lots of different software metrics discovered and used for defect prediction in the literature. Instead of dealing with so many metrics, it would be practical and easy if we could determine the set of metrics ...
On the feature extraction in discrete space
(Elsevier Sci Ltd, 2014-05)
In many pattern recognition applications, feature space expansion is a key step for improving the performance of the classifier. In this paper, we (i) expand the discrete feature space by generating all orderings of values ...