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dc.contributor.authorİdemen, Mehmet Mithaten_US
dc.contributor.authorBüyükaksoy, İbrahim Alinuren_US
dc.date.accessioned2015-01-12T13:56:40Z
dc.date.available2015-01-12T13:56:40Z
dc.date.issued1999-05
dc.identifier.citationİdemen, M. M. & Büyükaksoy, A. (1999). Comments on "upper cutoff frequency of the bound wave and new leaky wave on the slotline" [and reply]. IEEE Transactions on Microwave Theory and Techniques, 36; 47(5), 660-661. doi:10.1109/22.763175en_US
dc.identifier.issn0018-9480
dc.identifier.urihttps://hdl.handle.net/11729/77
dc.identifier.urihttp://dx.doi.org/10.1109/22.763175
dc.description.abstract[No abstract available]en_US
dc.language.isoengen_US
dc.publisherIEEE-INST Electrical Electronics Engineers Incen_US
dc.relation.isversionof10.1109/22.763175
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectSlot linesen_US
dc.subjectCutoff frequencyen_US
dc.subjectDifferential equationsen_US
dc.subjectFourier transformsen_US
dc.subjectIntegral equationsen_US
dc.subjectMathematicsen_US
dc.subjectMicrowave theory and techniquesen_US
dc.subjectSlotlineen_US
dc.subjectStripsen_US
dc.subjectBound waveen_US
dc.subjectLeaky waveen_US
dc.subjectPrinted circuit lineen_US
dc.subjectUpper cutoff frequencyen_US
dc.titleComments on "upper cutoff frequency of the bound wave and new leaky wave on the slotline"en_US
dc.typeletteren_US
dc.description.versionPublisher's Versionen_US
dc.relation.journalIEEE Transactions on microwave theory and techniquesen_US
dc.contributor.departmentIşık Üniversitesi, Fen Edebiyat Fakültesi, Enformasyon Teknolojileri Bölümüen_US
dc.contributor.departmentIşık University, Faculty of Arts and Sciences, Department of Information Technologiesen_US
dc.contributor.authorID0000-0002-1225-7482
dc.identifier.volume47
dc.identifier.issue5
dc.identifier.startpage660
dc.identifier.endpage660
dc.peerreviewedYesen_US
dc.publicationstatusPublisheden_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.contributor.institutionauthorİdemen, Mehmet Mithaten_US
dc.relation.indexWOSen_US
dc.relation.indexScopusen_US
dc.relation.indexScience Citation Index Expanded (SCI-EXPANDED)en_US
dc.description.qualityQ2
dc.description.wosidWOS:000080194600026


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