Transmission increase upon switching of VO2 thin films on microstructured surfaces
Haglund, Richard F.
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CitationKarakurt, İ., Boneberg, J., Leiderer, P., Lopez, R., Halabica, A. & Haglund, R. F. (2007). Transmission increase upon switching of VO2 thin films on microstructured surfaces. Applied Physics Letters, 91(9), 091907-091907-3. doi:10.1063/1.2776368
The authors compare transmission measurements of near-infrared light through VO2 thin films on smooth substrates and on ordered arrays of silica microspheres. When the samples are heated above the critical temperature for the semiconductor-metallic phase transition, smooth thin films show reduced transmission independent of thickness; however, the VO2 film deposited on the microspheres may show either reduced or enhanced transmission, depending on VO2 film thickness. They show that this at a first glance, unexpected behavior is directly related to the change of scattering efficiency upon the phase transition. This suggests that optical transmission through thin-film microstructures could be tuned by an appropriate combination of microsphere ordering and VO2 film thickness.