Electromagnetic imaging of rough dielectric surface profiles using a single-frequency reverse time migration method

An electromagnetic imaging scheme, which makes use of a single-frequency reverse time migration (RTM) technique to reconstruct two-dimensional (2D) rough surface profiles from the scattered field data, is formulated and implemented. The unknown surface profile, which is expressed as a one-dimensional height function, is the interface between two dielectric media. It is assumed that the profile is illuminated from one side and the scattered fields are “measured” along a line on this same side. RTM is used to construct a cross-correlation imaging functional that is numerically evaluated to yield an image of the investigation domain. The maxima of this functional yields an accurate reconstruction of the rough dielectric surface profile.