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dc.contributor.authorYıldız, Olcay Taneren_US
dc.contributor.authorAlpaydın, Ahmet İbrahim Ethemen_US
dc.date.accessioned2019-08-31T12:10:23Z
dc.date.accessioned2019-08-05T16:04:56Z
dc.date.available2019-08-31T12:10:23Z
dc.date.available2019-08-05T16:04:56Z
dc.date.issued2013
dc.identifier.citationYıldız, O. T. & Alpaydın, A. İ. E. (2013). Statistical tests using hinge/ε-sensitive loss. Paper presented at the Computer and Information Sciences III - 27th International Symposium on Computer and Information Sciences, ISCIS 2012, 153-160. doi:10.1007/978-1-4471-4594-3-16en_US
dc.identifier.urihttps://hdl.handle.net/11729/1907
dc.identifier.urihttps://dx.doi.org/10.1007/978-1-4471-4594-3-16
dc.description.abstractStatistical tests used in the literature to compare algorithms use the misclassification error which is based on the 0/1 loss and square loss for regression. Kernel-based, support vector machine classifiers (regressors) however are trained to minimize the hinge (ε-sensitive) loss and hence they should not be assessed or compared in terms of the 0/1 (square loss) but with the loss measure they are trained to minimize. We discuss how the paired t test can use the hinge (ε-sensitive) loss and show in our experiments that doing that, we can detect differences that the test on error cannot detect, indicating higher power in distinguishing between the behavior of kernel-based classifiers (regressors). Such tests can be generalized to compare L > 2 algorithms.en_US
dc.language.isoengen_US
dc.publisherSpringer-Verlagen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectAlgorithmsen_US
dc.subjectDecision treesen_US
dc.subjectInformation scienceen_US
dc.subjectKernel based classifiersen_US
dc.subjectMisclassification erroren_US
dc.subjectNeural networksen_US
dc.subjectStatistical testsen_US
dc.subjectSupport vector machine classifiersen_US
dc.subjectSupport vector machinesen_US
dc.subjectT-testsen_US
dc.titleStatistical tests using hinge/ε-sensitive lossen_US
dc.typeconferenceObjecten_US
dc.description.versionPublisher's Versionen_US
dc.relation.journalComputer and Information Sciences III - 27th International Symposium on Computer and Information Sciences, ISCIS 2012en_US
dc.contributor.departmentIşık Üniversitesi, Mühendislik Fakültesi, Bilgisayar Mühendisliği Bölümüen_US
dc.contributor.departmentIşık University, Faculty of Engineering, Department of Computer Engineeringen_US
dc.contributor.authorID0000-0001-5838-4615
dc.identifier.startpage153
dc.identifier.endpage160
dc.peerreviewedYesen_US
dc.publicationstatusPublisheden_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.contributor.institutionauthorYıldız, Olcay Taneren_US
dc.relation.indexScopusen_US


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