Electromagnetic imaging of rough dielectric surface profiles using a single-frequency reverse time migration method

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dc.authorid0000-0001-5168-4367
dc.authorid0000-0003-3867-5786
dc.contributor.authorSefer, Ahmeten_US
dc.contributor.authorYapar, Alien_US
dc.contributor.authorBağcı, Hakanen_US
dc.date.accessioned2023-10-17T18:26:10Z
dc.date.available2023-10-17T18:26:10Z
dc.date.issued2023-07
dc.departmentIşık Üniversitesi, Mühendislik ve Doğa Bilimleri Fakültesi, Elektrik-Elektronik Mühendisliği Bölümüen_US
dc.departmentIşık University, Faculty of Engineering and Natural Sciences, Department of Electrical and Electronics Engineeringen_US
dc.description.abstractAn electromagnetic imaging scheme, which makes use of a single-frequency reverse time migration (RTM) technique to reconstruct two-dimensional (2D) rough surface profiles from the scattered field data, is formulated and implemented. The unknown surface profile, which is expressed as a one-dimensional height function, is the interface between two dielectric media. It is assumed that the profile is illuminated from one side and the scattered fields are “measured” along a line on this same side. RTM is used to construct a cross-correlation imaging functional that is numerically evaluated to yield an image of the investigation domain. The maxima of this functional yields an accurate reconstruction of the rough dielectric surface profile.en_US
dc.description.versionPublisher's Versionen_US
dc.identifier.citationSefer, A., Yapar, A. & Bağcı, H. (2023). Electromagnetic imaging of rough dielectric surface profiles using a single-frequency reverse time migration method. Paper presented at the IEEE Antennas and Propagation Society, AP-S International Symposium (Digest), 2023-07, 467-468. doi:10.1109/USNC-URSI52151.2023.10237795en_US
dc.identifier.doi10.1109/USNC-URSI52151.2023.10237795
dc.identifier.endpage438
dc.identifier.isbn9781665442282
dc.identifier.isbn9781665442275
dc.identifier.isbn9781665442299
dc.identifier.issn1947-1491
dc.identifier.issn1522-3965
dc.identifier.scopus2-s2.0-85172411947
dc.identifier.scopusqualityN/A
dc.identifier.startpage467
dc.identifier.urihttps://hdl.handle.net/11729/5769
dc.identifier.urihttp://dx.doi.org/10.1109/USNC-URSI52151.2023.10237795
dc.identifier.volume2023-07
dc.indekslendigikaynakScopusen_US
dc.institutionauthorSefer, Ahmeten_US
dc.institutionauthorid0000-0001-5168-4367
dc.language.isoenen_US
dc.peerreviewedYesen_US
dc.publicationstatusPublisheden_US
dc.publisherIEEEen_US
dc.relation.ispartofIEEE Antennas and Propagation Society, AP-S International Symposium (Digest)en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectElectromagnetic imagingen_US
dc.subjectInverse electromagnetic scatteringen_US
dc.subjectReverse time migrationen_US
dc.subjectRough surfaceen_US
dc.titleElectromagnetic imaging of rough dielectric surface profiles using a single-frequency reverse time migration methoden_US
dc.typeConference Objecten_US

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