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Teaching aliasing and spectral leakage through the sampling of images

dc.contributor.authorTavşanoğlu, Ahmet Vedaten_US
dc.date.accessioned2019-08-31T12:10:23Z
dc.date.accessioned2019-08-05T16:04:52Z
dc.date.available2019-08-31T12:10:23Z
dc.date.available2019-08-05T16:04:52Z
dc.date.issued2019-05-29
dc.identifier.citationTavşanoğlu, A. V. (2019). Teaching aliasing and spectral leakage through the sampling of images. Paper presented at the Proceedings - IEEE International Symposium on Circuits and Systems, 1-5. doi:10.1109/ISCAS.2019.8702592en_US
dc.identifier.isbn9781728103976
dc.identifier.issn0271-4310
dc.identifier.urihttps://hdl.handle.net/11729/1834
dc.identifier.urihttps://dx.doi.org/10.1109/ISCAS.2019.8702592
dc.description.abstractAliasing and spectral leakage are artifacts of sampling and rectangular windowing, respectively, whose manifestations are noticed in both the spatial and frequency domains. This paper aims to provide a classroom example which enables the recognition and mathematical interpretation of such phenomena.en_US
dc.language.isoengen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.relation.isversionof10.1109/ISCAS.2019.8702592
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subject2-D Fourier transformen_US
dc.subjectAliasingen_US
dc.subjectSamplingen_US
dc.subjectSpectral leakageen_US
dc.subjectWindowingen_US
dc.titleTeaching aliasing and spectral leakage through the sampling of imagesen_US
dc.typeconferenceObjecten_US
dc.description.versionPublisher's Versionen_US
dc.relation.journalProceedings - IEEE International Symposium on Circuits and Systemsen_US
dc.contributor.departmentIşık Üniversitesi, Mühendislik Fakültesi, Elektrik-Elektronik Mühendisliği Bölümüen_US
dc.contributor.departmentIşık University, Faculty of Engineering, Department of Electrical-Electronics Engineeringen_US
dc.contributor.authorID0000-0001-8590-1518
dc.identifier.volume2019
dc.identifier.startpage1
dc.identifier.endpage5
dc.peerreviewedYesen_US
dc.publicationstatusPublisheden_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.contributor.institutionauthorTavşanoğlu, Ahmet Vedaten_US
dc.relation.indexWOSen_US
dc.relation.indexScopusen_US
dc.relation.indexConference Proceedings Citation Index – Science (CPCI-S)en_US
dc.description.wosidWOS:000483076402060


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